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CM
- 28 - XTH0150
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Specification
- Travel
- X.Y axis : 50x50mm (with 1"
gauge block).
- Working
distance : 67 mm
- Magnification
: 30x (15x eyepiece X 2x object
lens).
- The
eyepiece and angle can be measured
in 6 minutes.
- Crossed
roller bearings and key way stage
construction ensure a true linear
traverse in X and Y axis.
- Large
dovetail assures 2 axis squareness
in relation to the stage surface.
- Sighting
device : cross - hair.
- Optional
: digital micrometer 0 - 25mm, resolution
1µ m.
digital micrometer 0 - 50mm, resolution
1 µ m.
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CM
- 28 - L2003A
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Eyepiece
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WF
10X (standard)
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Standard
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Optional
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Object
Lens
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10X
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40X
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60X
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PL.
4
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ACH.
10
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40X
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100X
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Magnification
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100X
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400X
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600X
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40X
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100X
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400X
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1000X
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Eyepiece
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WF
16X (Optional)
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WF
20X (Optional)
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Standard
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Optional
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Standard
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Optional
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Object
Lens
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10X
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40X
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60X
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PL.
4
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ACH.
10
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40X
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100X
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10X
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40X
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60X
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PL.
4
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ACH.
10
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40X
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100X
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Magnification
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160X
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640X
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960X
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64X
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160X
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640X
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1600X
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200X
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800X
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1200X
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80X
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200X
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800X
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2000X
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Specifications
- Eyepieces
: WF10X ;Optional : WF16X, 20X,
plan reticle eyepiece 10X (0.1mm/DIV.)
- Objectives
(No cover glass) : PL10X, PL40X
(spring), PL60X (spring), Ach.4x.
optional : PL.4X ; ACH.10X, 40X
(spring), 100X (spring).
- Illumination
System : reflected light illuminator,
6V/20W halogen lamp, adjustable
brightness, with polarizer.
- Optional
: photo attachment: 10X or 4X photo
attachment; 2.5X/4X change over
photo attachment ; multi-purpose
photo adapter.
- Application
: metallurgical microscope can be
used for observation of substrate
that is clear, semi clear with an
opaque pattern such as metal, ceramic,
electronic ceramic, IC, PC boards,
LCD, thin films, fiber, metallizing
and other metallid in electronics
chemical, metallirrgi and precision
machine industries.
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Note
: For model & technical specification detail, please contact
our sales department
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