 Formcorder
Series Profiles |
|
|
| Measuring
Range |
Z:2mm
X:4mm |
|
| Measuring
Accuracy |
±
0.35% |
| Stylus |
R25um,
4mN or less |
| Measuring
Magnification |
100 to 1000 times in X and Z axis |
|
|
| Formcorder
EF150 |
- Standard
Contour Measuring Instrument
- High
Magnification Type and PC Based Control
Type are Selectable
|
|
| Measuring
Range |
Z:50mm
X:100mm |
|
| Measuring
Accuracy |
±0.25% |
| Stylus |
R25um,
30mN or less |
| Traceable
Angle |
Ascend:77
degrees
Descend: 87 degrees |
| Measuring
Magnification |
1
to 200 times in X and Z axis |
|
|
| Formcorder
EF3000 |
- Digital
Sensor in Z and X axis, Resolution 0.1um
For Both
|
|
| Measuring
Range |
Z:58mm
X:100mm |
|
| Stylus |
R25um,
30mN or less |
| Traceable
Angle |
Ascend:77
degrees
Descend: 87 degrees |
| Analysis
Function |
Element
/ Scalar / Master Comparison / Gothic Arc
/ Non Sphere |
|
|
| Formcorder
SEF3500 |
- Combination
Unit With Contour and Roughness Tester
- Operation
and Analysis on Windows
|
|
|
Contour
|
|
| Measuring
Range |
Z:50mm
X:100mm |
| Analysis
Function |
Element
/ Scalar / Master Comparison /Gothic Arc
/ Non Sphere |
Stylus
|
R25um,
30mN or less |
| Roughness |
| Measuring
Parameter |
46
kinds |
| Measuring
Range |
Z
0.6mm, X 100mm |
| Stylus |
R2um,
0.7mN |
|
|
|
| Formcorder
SEF3500K |
-
Combination Unit With Contour and 2D/3D Roughness
Tester
- Operation
and Analysis on Windows
|
|
|
Contour
|
|
| Measuring
Range |
Z:50mm
X:100mm |
| Analysis
Function |
Element
/ Scalar / Master Comparison /Gothic Arc / Non
Sphere |
Stylus
|
R25um,
30mN or less |
| Roughness
2D |
| Measuring
Parameter |
46
kinds |
| Measuring
Range |
Z
0.6mm, X 100mm |
| Stylus |
R2um,
0.7mN |
| Roughness
3D |
| Measuring
Parameter |
17
kinds |
| Measuring
Range |
Z
0.6mm, X 100mm, Y 100mm |
| Stylus |
R2um,
0.7mN |
|
|
| Formcorder
DSF1000 |
-
Laser Interferometer Method Pick Up
Roughness and Contour Measuring by One Scanning
|
|
|
Contour
|
|
| Stylus |
R5um
/ 4mN, R25um / 4mN |
| Traceable
Angle |
Maximum
45 degrees |
Analysis
Function
|
Contour(Element
/ Scalar / Statistic /Master Comparison / NG check)/Roughness(JIS,
ISO, DIN, ASME, BS)/Waviness(JIS) |
| Resolution
/ Measuring Range |
10nm
/ 6mm, 20nm / 12mm
|
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